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				 Electron paramagnetic resonance (EPR) measurements have been made for two perpendicular planes in a LiYF 4  crystal before and after x-ray irradiation at room temperature. Analysis of the EPR spectrum angular dependence shows the presence of two defects - an impurity ion, which was embedded during the crystal growth process, and an x-ray induced defect with the g-factor of approx. 2.0. Spectral parameters and possible defect models are discussed.

Epr Spectrum Angular Dependences In Liyf4 Crystal / Epr Spektru Leņķiskās Atkarības Liyf4 Kristālā