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The layers near the interface of explosively welded plates were investigated by means of microscopic observations with the use of transmission electron microscopy (TEM) equipped with energy dispersive spectrometry and scanning electron microscopy equipped with electron backscattered diffraction facility (SEM/EBSD). The metal compositions based on carbon or stainless steels (base plate) and Ti, Zr and Ta (flyer plate) were analyzed. The study was focused on the possible interdiffusion across the interface and the changes in the dislocation structure of bonded plates in the layers near-the-interface

Characterization of Explosive Weld Joints by TEM and SEM/EBSD