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XRD, UV-Vis-NIR and FT-IR Studies of ITO and Cr: ITO Thin Films Prepared by Electron Beam Evaporation Technique
Author(s) -
Deepannita Chakraborty,
S. Kaleemulla,
N. Madhusudhana Rao,
K Subbaravamma,
G V Mallikharjuna Rao
Publication year - 2017
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
DOI - 10.2412/mmse.36.15.807
Subject(s) - materials science , band gap , indium tin oxide , thin film , degenerate semiconductor , crystallite , doping , electron beam physical vapor deposition , semiconductor , analytical chemistry (journal) , indium , optical conductivity , transmittance , optoelectronics , nanotechnology , chemistry , metallurgy , chromatography

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