Built-In Self-Repair Scheme for Memory Systems

Built-in self-repair (BISR) technique is widely used to repair embedded random access memories (RAMs) due to the introduction of more and more system-on-chip and other highly integrated products, for which the chip yield is being dominated by the yield of on-chip memories and repairing embedded memories by conventional off-chip schemes is expensive. This paper presents an BISR generator, which automatically generates register transfer level BISR circuits for repairing RAMs, is based on a redundancy analysis (RA) algorithm that enhances the essential spare pivoting algorithm, with a more flexible spare architecture, which can configure the same spare to a row or a column to fit failure patterns more