English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

We propose novel methods of depth-resolved EELS (DREELS) and chemical state mapping, and the techniques were applied to the cross-sectional TEM (XTEM) sample of N + implanted TiO 2 catalyst. DREELS is realized by applying the Pixon deconvolution to a conventional energy-filtering TEM (EFTEM)-based spatially resolved EELS (EFTEM-SREELS), demonstrated by Kimoto et al. [J. Electron Microsc. 46 (1997) 369-374.]. And a self-modeling curve resolution (SMCR) technique in multivariate analysis enabled chemical state mapping from EFTEM-based spectrum imaging (EFTEM-SI) data sets. The methods successfully extracted the depth dependence of the N-K ELNES and separately displayed the spatial distributions of the constituent chemical states, whose spectral features were overlapped.

Depth-Resolved EELS and Chemical State Mapping of N<SUP>+</SUP>-Implanted TiO<SUB>2</SUB> Photocatalyst