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We use the scanning-electron-microscope-electron-backscattering diffraction (SEM-EBSD), atomic force microscopy (AFM), and calculations based on the phenomenological theory of martensite crystallography (PTMC) to study two types of martensite observed in ceria-doped zirconia. The results indicate that a plate-type martensite has various habit planes such as {301} t , {100} t , and {10 1 0} t , which suggests the association of different lattice correspondences and lattice-invariant shears in PTMC. A pyramid-type martensite has only {301} t habit plane. The shape strains of the variants associated with these habit planes are effective in accommodating the shape strains of the transformation in the near-surface region, as proposed by Deville et al. (2004). Although pyramidal structures appear predominantly on surfaces near the (001) t plane, they also appear on surfaces near (100) t and (010) t planes. These results are understood from the shape strains calculated by the PTMC.

Shape-Strain Analysis of Martensite in Ceria-Doped Zirconia