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Polycrystalline samples of Ag9TlTe5 with different nominal compositions: Ag9TlTeX (X ¼ 5:0, 5.05, 5.1, 5.2, 5.3, 5.5, 5.7, 6.0) were prepared and the phase relations were studied by X-ray diffraction (XRD) analysis. The electrical resistivity, Seebeck coefficient and thermal conductivity of Ag9TlTeX (X ¼ 5:0 5:5) were measured from room temperature to around 630 K. The dimensionless figure of merit (ZT )o f Ag9TlTe5:0 was quit low ( 0:08), while those of other samples were very high ( 1:0). It was confirmed that the thermoelectric properties of Ag9TlTe5 are significantly influenced by a minimal compositional deviation and the high ZT was obtained when the tellurium content was slightly larger than the stoichiometric composition. [doi:10.2320/matertrans.E-MRA2007837]

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Fabrication and Thermoelectric Properties of Ag&lt;SUB&gt;9&lt;/SUB&gt;TlTe&lt;I&gt;&lt;SUB&gt;X&lt;/SUB&gt;&lt;/I&gt; (&lt;I&gt;X&lt;/I&gt;=5.0&amp;sim;6.0)