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Formation of diffusionbarrier coating system with twolayered structure has been developed. The system comprises an inner xphase of the ReCrNb system as a diffusionbarrier layer and an outer Alreservoir layer. In this study, Re film was formed on Nb substrate via electroplating and the film changed into xRe3Nb phase by preliminary heat treatment at 1500°C for 1 h. Crpack cementation was conducted under vacuum of 10-5 Pa at 1300°C and 1400°C for 6 min and 1 h, respectively, using an Al2O3 crucible in which the specimens were buried in a powder mixture of pure Cr and Al2O3. The packed specimens were examined using an electron probe microanalyzer to determine the concentration profile of each element. The layer structure of the film on the Nb substrate after the Crpack cementation was discussed on the basis of composition paths plotted in the ReCrNb phase diagram. In the case of the specimen induced by Crpack cementation at 1300°C for 6 min, the alloy layers in the ReCrNb system consists of the g, Rerich, x and a phases. In the case of the specimen induced by Crpack cementation at 1300°C for 1 h and 1400°C for 6 min, the alloy layers in the ReCrNb system consisted of the g, x and a phases. By contrast, in the specimen induced by Crpack cementation at 1400°C for 1 h, the alloy layers in the ReCrNb system consists of the g, Nb(Cr, Re)2 and a phases. [doi:10.2320/jinstmet.J2015068]

Layer Structure of the &chi;-phase Film in the Re-Nb System Formed on Nb Substrate Induced by Cr-Pack Cementation

Layer Structure of the χ-phase Film in the Re-Nb System Formed on Nb Substrate Induced by Cr-Pack Cementation