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Metric patent studies since the end of the last century are a valuable tool for scientific technological and innovation surveillance, becoming an indispensable instrument for knowing the international technological behavior. However, patentometric studies are not applied optimally by all countries or by all international organizations, nor are all the potential of these studies used to know the different contexts of a country’s technological innovations. This research aims to analyze the metric behavior of patents granted in Cuba applying an own methodology that describes the main technological scientific innovations patented by the Cuban Office of Industrial Property. The proposed methodology uses proIntec software for the download, normalization, processing, analysis and visualization of data from patents, and applies a large group of relational and complex metrics, as well as social networking techniques to visualize the main behaviors of Cuban technological innovations. The final results show the potential of metric patent studies to represent the country’s technological developments and its contributions to the national science and technological innovation system.

Comportamiento métrico de las patentes concedidas en Cuba: su contribución a la innovación tecnológica nacional