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We used X-ray fluorescence (XRF) scanning on samples from Integrated Ocean Drilling Program Expeditions 320/321 Sites U1335– U1337 to measure sediment geochemical compositions at 2.5 and 5 cm resolution for a total of 937 m of spliced sediment column. Site U1335 was scanned from 0 to 302 meters composite depth (mcd), Site U1336 was scanned from 0 to 142.5 mcd, and Site U1337 was scanned from 0 to 491.6 mcd, which is the entire splice. Here we report the data and describe the data acquisition conditions to measure Al, Si, K, Ca, Ti, Mn, Fe, and Ba in the solid phase. We also describe a method to convert data from volumebased raw XRF scan data to a normalized mass measurement, ready for calibration by other geochemical methods. Both the raw and normalized data are reported along each of the splices for Sites U1335–U1337.

Data report: raw and normalized elemental data along the Site U1335, U1336, and U1337 splices from X-ray fluorescence scanning