English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

OBIC (Optical Beam Induced Current) microscope is an application of a scanning laser microscope. It enables to visualize a photo conductivity and/or depletion region of p-n junction in a semiconductor material. This paper briefly reviews the principle of photo current measurement, instrumentation, and some applications. Moreover, spectroscopic OBIC image has been investigated with the specially designed OBIC microscope which can switch the excitation wavelength.

A Method for the Measurement of Optical Beam Induced Current Using Scanning Laser Microscope.