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We describe progress in optics and instrumentation at beamline 1-BM, designed in part for time-resolved dispersive x-ray absorption fine structure (XAFS) measurements. The key optical element is a horizontally focusing curved-crystal monochromator that invokes a 4-point bending scheme and a liquid-metal cooling bath. The device has been designed for dispersive studies in the 5-24 keV range, with a horizontal focal spot size of {le}100 micrometers FWHM. To minimize thermal distortions and thermal equilibration time, the 355 {times} 32 {times} 0.8 mm crystal is nearly half submerged in a bath of Ga-In-Sn-Zn alloy, which thermally couples the crystal to the water-cooled Cu frame, while permitting the required crystal bending. Harmonic rejection, focusing schemes and the novel spectrometer positioning system will be described. For microsecond-resolution time-resolved studies, a fast CCD streak camera detector has been developed. Results from commissioning tests of the instrumentation are described. 11 refs., 4 figs

Instrumentation for time-resolved dispersive studies at Advanced Photon Source beamline 1-BM