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A novel in situ transmission electron microscopy technique for the observation of reaction processes in multilayered materials is reported. The technique involves constant heating rate experiments of multilayered materials in image and diffraction modes. Because the fine scale microstructure of multilayered materials is typically a small fraction of the TEM specimen thickness, realistic comparison of the microstructural evolution with that of similarly processed thick foil samples is possible. Such experiments, when well designed, can provide rapid characterization of phase transformations and stability of nano-structured materials. The results of these experiments can be recorded in both video and micrograph format. The results and limitations of this technique will be shown for the Al/Zr and Al/Monel multilayered systems

An in situ electron microscopy technique for the study of thermally activated reactions in multilayered materials