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Microstructure determines the yield of free charge in neat semiconducting polymers. Understanding the fundamental photophysics of poly(3-hyxylthiophene) films, and that of conjugated polymers in general, is essential if we are to realize their full potential as low-cost active layers for coal-competitive solar power generation. Yet, the value of one of the most basic photophysical parameters of these materials - the yield of free charges upon photoexcitation of neat films - has remained controversial because of a wide variation between previous measurements. Researchers at the National Renewable Energy Laboratory (NREL) have resolved this controversy by showing that the yield of free charges depends sensitively on the solid-state microstructure of the film. The microstructure was varied systematically through control of the polymers molecular weight and processing conditions, while the charge carrier yield was measured using time-resolved microwave conductivity - a unique technique to which only a few groups in the world have access. The researchers found that the yield of long-lived free charges depends on the co-existence of amorphous and crystalline domains in the polymer, and this behavior was attributed to charge separation at the interface between these two domains of order

Researchers Demonstrate Microstructure and Charge Yield in Semiconducting Polymers (Fact Sheet), NREL Highlights, Science