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The Authors propose a method for determination of microbolometer matrix gain non-uniformity with the aid of infrared emitters built into an infrared camera. This paper presents the research results on this subject with two types of infrared emitters - ring and spotlight. Obtained results are in favour of the ring emitter - in case of spotlight there is a risk of unwanted artifacts. Periodical determination of microbolometers’ gain values in thermal camera enables verification that these remain unchanged. In case of detection that gain values changed, it is possible to compensate for observed differences.

Microbolometer matrix gain non-uniformity determination and correction with the aid of ring and spot infrared emitters