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Two original thermal emissivity measurement devices were developed recently in the laboratory. One of these devices uses a source as a means of heating a sample, and exhibits a certain number of advantages, including the absence of parasitic radiation on the surface studied, and the temperature homogeneity of the sample. This method was applied in measuring the emissivity of bulk ceramics and ceramic deposits on metallic or ceramic substrates. The second test facility, applied to opaque materials, measures the directional spectral emissivity and makes it possible to work back by calculation to the total hemispherical spectral emissivity. As an example, these two methods were used for characterizing thermal barriers for turbine vanes and materials that could be used in a High Temperature Reactor (HTR).

New Methods for Measuring the Thermal Emissivity of Semi-transparent and Opaque Materials