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Conventional reliability demonstration test (RDT) based on statistical method is widely used in industry as it is simple and convenient to apply. But for products with high reliability and long life, this test method fails to satisfy the demand for short cycle and low cost, and is liable to cause the phenomenon of over-test and short-test. This paper gives a method to determine the accelerated stress profile for RDT under multiple stresses and mechanisms, making it faster to make decision of accept or reject. By raising the levels of sensitive stresses that the product would experience, the test time can be cut down remarkably. We can derive the overall acceleration factor based on the narrow reliability bounds theory. Then we choose the test plan referring to GJB 899A. Furthermore, combined with the reliability qualification test (RQT) profile, the accelerated test profile is acquired. An example is given to illustrate the superior performance of the proposed method over traditional methods.

Method to determine test profile in accelerated reliability demonstration test under Type-I censoring