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Sulfur is an important volatile element involved in magmatic systems. Its quantification in silicate glasses relies on state-of-the-art techniques such as electronprobe microanalyses (EPMA) or X-ray absorption spectroscopy but is often complicated by the fact that S dissolved in silicate glasses can adopt several oxidation states (S 6+  for sulfates or S 2−  for sulfides). In the present work, we use micro-Raman spectroscopy on a series of silicate glasses to quantify the S content. The database is constituted by 47 silicate glasses of various compositions (natural and synthetic) with S content ranging from 1179 to 13 180 ppm. Most of the investigated glasses have been synthesized at high pressure and high temperature and under fully oxidizing conditions. The obtained Raman spectra are consistent with these  f  O 2   conditions and only S 6+  is present and shows a characteristic peak located at ~1000 cm −1  corresponding to the symmetric stretch of the sulfate molecular group (ν 1SO  4   2  −$\begin{array}{} \text{SO}_4^{2-} \end{array} $   ). The intensity of the ν 1SO  4   2  −$\begin{array}{} \text{SO}_4^{2-} \end{array} $    peak is linearly correlated to the parts per million of S 6+  determined by EPMA. Using subsequent deconvolution of the Raman spectra, we established an equation using the ratio between the areas of the ν 1SO  4   2  −$\begin{array}{} \text{SO}_4^{2-} \end{array} $    peak and the silicate network species (Q n ) in the high-frequency region:ppm S   6  +    =  34371    A   SO  4   2  −A   Q   n±  609.$$\begin{array}{} \text{ppm S}^{6+}=34371\frac{A\text{SO}_4^{2-}}{A\text Q^{\text n}}\pm609. \end{array} $$

A Raman calibration for the quantification of SO 4 2− groups dissolved in silicate glasses: Application to natural melt inclusions