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Randomly amplified polymorphic DNA (RAPD) molecular markers were used to construct a partial genetic linkage map in a recombinant inbred population derived from the common bean ( Phaseolus vulgaris  L.) cross PC-50 × XAN-159 for studying the genetics of bacterial disease resistance in common bean. The linkage map spanned 426 cM and included 168 RAPD markers and 2 classical markers with 11 unassigned markers. The seventy recombinant inbred lines were evaluated for resistance to two strains of common bacterial blight [ Xanthomonas campestris  pv.  phaseoli  (Smith) Dye] ( Xcp ). Common bacterial blight (CBB) resistance was evaluated for  Xcp  strain EK-11 in later-developed trifoliolate leaves and for  Xcp  strains, DR-7 and EK-11, in first trifoliolate leaves, seeds, and pods. One to four quantitative trait loci (QTLs) accounted for 18% to 53% of the phenotypic variation for traits. Most significant effects for CBB resistance were associated with one chromosomal region on linkage group 5 and with two regions on linkage group 1, of the partial linkage map. The chromosomal region (a 13-cM interval) in linkage group 5 was significantly associated with resistance to  Xcp  strains DR-7 and EK-11 in leaves, pods, and seeds. The regions in linkage group 1 were also significantly associated with resistance to both  Xcp  strains in more than one plant organ. In addition, a seedcoat pattern gene ( C ) and a flower color gene ( v lae  ) were mapped in linkage groups 1 and 5, respectively, of the partial linkage map. The  V  locus was found to be linked to a QTL with a major effect on CBB resistance.

Molecular-marker-based Genetic Analysis of Tepary Bean-derived Common Bacterial Blight Resistance in Different Developmental Stages of Common Bean