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A non-destructive method is developed to determine the stress profile in double ion-exchanged lithium aluminosilicate glass. In this method, the steep compressive stress distribution from the surface to a depth of 10 ̄m is evaluated by the optical guidedwave method. The stress distribution from a depth of 50 to 413 ̄m is determined by the scattered light technique, where the scattered light intensity observed normal to an incident polarized beam is recorded and the phase shift is calculated from it. The stress profile combined with the optical guided-wave and the scattered light methods is presented and its comparison with the sodium and potassium concentration distributions and the Raman peak shift is discussed.

Non-destructive stress measurement in double ion-exchanged glass using optical guided-waves and scattered light