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The knowledge of the refractive index of materials is important to the development of applications. Thus, have been developed several refractometry techniques for measuring the refractive index. Among the refractometry techniques we can cite the Abeles method, the ellipsometry, a hollow prism that allows you to store liquid to be measured the refractive index, etc. Many interferometric methods for determining the refractive index of materials have also been developed [1] [2] . They can use the Rayleigh refractometer, Mach-Zehnder, Jamin, Fabry-Perot and Michelson. The Michelson interferometer can be used for refractive index and thickness measurements of glasses and thin films. These measurements can be performed with great precision, since interferometry technique utilizes the interference nanometers wavelength . In this work we assemble a Michelson interferometer for measuring the refractive index of erbium doped glasses synthesized in UNESP Araraquara with potential application in the fabrication of photonic crystals. The measurement of refractive index is obtained by rotating the sample placed in an interferometer arm, creating an optical path variation, and hence the movement of the interference fringes. The expression for the refractive index in terms of the number of fringes collapsing and the angle by which the sample has been rotated is given by:      2 1 cos

Michelson interferometer application for measuring films and glass refractive index