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Polycrystalline Cadmium sulfide (CdS) films were deposited onto Corning glass substrates from alkaline solutions containing CdCl2, KOH, Na3C6H5O7 and CS(NH2)2 at different deposition times (10, 20, 30, 40 and 50 min), different bath temperatures and different concentration of the reactants. A comparative study was performed out on thin film via optical transmission and X-ray diffraction (XRD) measurements which reveal that the deposition time has a profound influence on the growth rate and band gap of the deposited layers. Diffraction data are used to evaluate the lattice parameter, grain size, average strain, number of crystallites per unit area and dislocation density in the film are calculated.

Correlation between Optical and Structural Properties of Chemically Deposited CdS Thin Films