English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Competing failure involving performance degradation and catastrophic failure can be found in many products [8, 22]. During the working span, if any one of the failure modes occurs first, the product fails. The performance degradation failure, which is also termed soft failure, is due to aging degradation which makes the performance value reach an unacceptable level. Compared with the degradation failure, the catastrophic failure is more severe because the product may not function once it occurs [15]. For example, a semiconductor device’s failure may be due to electrical malfunctions or mechanical fatigue of I/O connectors (e.g., solder joints, etc.). The failure of the insulation system of a DC motor can be attributed to turn failure, phase failure, or ground failure. Failures of ball bearing assemblies are attributed to either race or ball failures [23]. Competing failure is an important failure concept for products, so it is significant to study the reliability of products with competing failure modes. Reliability analysis for products that experience only degradation has been extensively studied in the literature. Lu et al. [20] presented a general mixed-effects path model and used a two-stage approach to estimate the parameters of normally distribution. Subsequently, Lu and Meeker [21] used a simple degradation model to compare degradation analysis and traditional failure-time analysis in terms of asymptotic efficiency, and the results showed that degradation analysis provided more precision estimations. Bae and Kvam [2] developed a nonlinear random-effect model to describe the degradation of vacuum fluorescent displays. Furthermore, Bae et al. [3] investigated the link between a choosing mixed-effects model and the resulting lifetime model and pointed out that the degradation implied the lifetime distribution. In addition, stochastic process formulations have Junxing LI Yongbo ZHANG Zhihua WANG Huimin FU Lei XIAO

Reliability analysis of the products subject to competing failure processes with unbalanced data