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This paper proposes a voltage-based hot-spot detection method for defective cells in PV module using projector. The presence of internal crystal defects is one of the main causes of hot-spot phenomenon in PV modules. Authors previously investigated the physical characteristics of hot-spot phenomenon referring to internal crystal defect. Based on it, a hot-spot detection method named as current-based SRC (self reverse current) detection method is developed. However, it becomes extraordinarily complicated to determine the defective cells under low illumination. In order to avoid this disadvantage, authors improve the SRC detection method by applying voltage. From the feasibility experiment results, it is confirmed that by calculating cell HSI (hotspots index) with voltage, the PV modules with defective cells can be prospectively excluded even under low illumination.

Voltage-Based Hot-Spot Detection Method for Defective Cell in Photovoltaic Module Using Projector