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Electron paramagnetic resonance (EPR) was used to study an oligodeoxynucleotide duplex of d(CGCG)(2) that is known to crystallize in Z-form. After X irradiation at 4 K, EPR data were collected on single crystals and polycrystalline samples as a function of annealing temperature and dose. A radical produced by the net gain of a hydrogen atom at C6 and a proton at N3, Cyt(C6+H, N3+H(+))(+*), is identified. This radical had not been positively identified in polymeric DNA previously. The Cyt(C6+H, N3+H(+))(+*) makes up about 4% of the total radical population at 4 K, increasing to about 10-15% after the DNA is annealed to 240 K. There appears to be neither an increase nor a decrease in the absolute concentration of Cyt(C6+H, N3+H(+))(+*) upon annealing from 4 K to 240 K. Additionally, the presence of another radical, one due to the net gain of hydrogen at C5 of cytosine, the Cyt(C5+H)(*), is implicated. Together, these two radicals appear to account for 60-80% of the reduced species in DNA that has been irradiated at 4 K and annealed to 240 K.

Reductive Damage in Directly Ionized DNA: Saturation of the C5 = C6 Bond of Cytosine in d(CGCG)2Crystals

Reductive Damage in Directly Ionized DNA: Saturation of the C5 = C6 Bond of Cytosine in d(CGCG)₂Crystals