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Electronic and magnetic properties of nanoscale materials are closely related to the atomic arrangement at the interface shared by different chemical elements. A very precise knowledge of the surface/interface structure is then essential to properly interpret the new properties coming out. Of a particular interest is the relationship between structure, morphology and magnetic properties of exchanged-coupled interfaces in ferromagnetic (FM) and antiferromagnetic (AF) materials. The interaction at the AF/FM interface modifies the magnetic switching properties of the FM film, which turn out to be a usefull property on new magnetic devices technology. We present here an investigation of the buried exchange-coupled interface (NiO/CoO)/(PtCo) grown on a Pt(111) single crystal. The magneto-optical Kerr effect reveals a strong coupling at the interface, by an increasing coercivity, and a spin reorientation of the FM film when ordering occurs in the AF layer. The combination of grazing incidence X-ray diffraction, X-ray reflectivity and soft X-ray resonant magnetic scattering yields a comprehensive description of the system.

Structure, morphology and magnetism of an ultra-thin [NiO/CoO]/PtCo bilayer with perpendicular exchange bias