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<abstract language="eng">This paper describes the construction of an eletrical current source and of a probe to be used in the measurement of eletrical conductivity through a four-point probe method. These pieces of equipments can be obtained at the low price of US$ 50.00 and are adequate for eletrical conductivity measurements in the semiconductor range, that is from 10-1 to 10-6 S cm-1

Construção de uma fonte de corrente e de uma sonda para medida de condutividade pelo método da sonda de quatro pontas