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Due to outsourcing of numerous stages of the IC manufacturing process to different foundries, the security risk, such as hardware Trojan becomes a potential threat. In this paper, we present a layout aware localized hardware Trojan detection method that magnifies the detection sensitivity for small Trojan in power-based side-channel analysis. A scan segmentation approach with a modified launch-on-capture (LoC) transition delay fault test pattern application technique is proposed so as to maximize the dynamic power consumption of any target region. The new architecture allows activating any target region and keeping others quiet, which reduces total circuit toggling activity. We evaluate our approach on ISCAS89 benchmark and two practical circuits to demonstrate its effectiveness in side-channel analysis. key words: hardware Trojan, scan segmentation, LoC patterns, power side-channel analysis, TDGP

An Effective and Sensitive Scan Segmentation Technique for Detecting Hardware Trojan