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Long-term processes of cathodoluminescence degradation of thin film phosphors Zn{sub 2}SiO{sub 4}:Ti and Zn{sub 2}GeO{sub 4}:Mn were investigated in a wide range of e-beam energies, current and power densities. The time dependencies describing decreasing of emission intensity have been found. At high-level densities of e-beam irradiation the specific behavior of long-term degradation processes was observed, which is characteristic with rapid degradation at initial stage and slow consequent decrease of intensity. The most probable mechanisms responsible for long-term processes of degradation in investigated phosphors are proposed.

Long-Term Cathodoluminescent Characterization of Thin-Film Oxide Phosphors in a Wide Range of Electron Excitation Densities