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Direct electrical measurement of single grain boundaries is performed for ZnO-based multilayer ceramic varistors with fine grains of 2 µm, using a nano-prober. The effect of ZnO grains on non-linearity is shown to be significant. The microstructure is comprised at least two non-linear types as good- and bad-junctions. The numerical ratio of good to bad is estimated to be about one (non-linearity exponent α max ≥ 10) to two (

Non-linearity variation of single junctions and its analysis using nano-prober within fine-grained ZnO-based multilayer varistors