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Electrophysical parameters of Hg1−xCdxTe thin films grown by liquid-phase epitaxy and molecular-beam epitaxy were investigated before and after the highfrequency sonication ( fUS = 7.5 MHz, WUS ∼ 10 W/m). It was determined that parameters of MBE-grown Hg1−xCdxTe thin films are stable to ultrasound effect, while for thin films grown by LPE the sonically stimulated change of the conductivity type was observed. The best agreement between experiment and calculation was obtained in the frame of the assumption about forming of the thin layer with another conductivity type. The possible nature of the observed effect was analyzed.

Layered structure formation in Hg1−xCdxTe films after high-frequency sonication