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The equations of a regression were obtained by methods of mathematical planning of many- factors experiments. These equations determine a dependence of thermoelectric parameters of PbTe thin films prepared by hot wall the method from technological factors: temperatures of evaporation, walls of the chamber and deposition. PbTe thin films were layed sieged on pins (111) of BaF2 monocrystals and on amorphous polyamid fillet PM-1. The ranges of change of these thermoelectic parametres were determined. They respond to the best values of thermoelectric parameters of PbTe thin films. It is shown that the value of thermoelectric parameters of PbTe thin polycrystalline films is bigger in several times then the monocrystalline ones.

Thermoelectric property features of PbTe monocrystalline and polycrystalline films