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Brightness decay in electroluminescent (EL) phosphors is a diffusion-related phenomenon. Copper is shown to be the most easily diffusing species, although all diffusion is strongly influenced by the presence of sulfur vacancies or, to a lesser extent, halogen atoms substituting on sulfur sites. Diffusion is facile in the Cu 2− x  S which decorates the defects in EL phosphors, and bond valence sums harmonize well with the existence of a plethora of copper sulfide binary phases. Strategies for improving the useable lifetimes of EL phosphors are examined.

A bond valence analysis of electroluminescent ZnS: Cu, Cl to elucidate the aging mechanism