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Integrated x-ray intensities have been measured for 21 reflections in the 2 θ  range up to 150° of polycrystalline Ni 2 SiO 4  spinel (a quench product from 40 kbar, 900°C). Using the observed structure factors of these 21 reflections and the least-squares structure refinement computer program of F inger  (1969), refinements were performed on the cation occupancy, the oxygen parameter, three temperature factors and the scale factor. The final  R  value is 0.069.

Structure refinement of high-pressure Ni 2 SiO 4 spinel