English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Crystals of silicon carbide are often structurally inhomogeneous, consisting of a number of domains of different structures or polytypes. By the application of x-ray diffraction topography it is possible both to identify the polytypes present in a crystal and to determine the configuration of their domains. This method is illustrated by application to a crystal with epitaxial growth and a crystal with laminar domains of different polytypes.

The study of polytypism in silicon carbide by x-ray diffraction topography