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A new combined field ionisation/electron impact ion source is described which can be used in connection with a direct inlet probe. The distance between the electron beam and the wire emitter is only one mm, sot hat the vapour of the sample reaches both ionizing zones. The vapour passes the ion source as a quasi molecular beam. Results obtained with this source will be given.

A Combined Field Ionisation/Electron Impact Ion Source for High Molecular Weight Samples of Low Volatility