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Defects of the electron scattering formula based on Thomas-Fermi atom model and of Lei segang's formula, are first briefly discussed in relation to image contrast problem in Electron Microscopy. A few aspects of the electron scattering formula of Lenz are then considered particularly for dealing with elements of low atomic number. From a consideration of this formula it is shown that the image contrast of a given mass thickness of object is liable to be dependent on the atomic number of the object.

Considerations of image contrast in Electron Microscopy of objects composed of low atomic number