English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

In the present work, amorphous Si 0.40 C 0.24 N 0.36  samples were investigated. X-ray and neutron diffraction experiments were performed, in order to evaluate the structure factors by the method of contrast variation. The structure can be described as crosslinked Si-N-C matrices. Within these matrices SiN 4  tetrahedra are predominant. Direct Si-Si contact does not occur. We report on the short range order and the nature of chemical bonding.

A Diffraction Study of Amorphous Si 0.40 C 0.24 N 0.36