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Fringe spacings were measured at the three different diffraction conditions: 0002-Bragg position, 0004-Bragg position and the symmetric position for 000l systematic reflections. The absolute value |V 0002 | and the phase angle Φ 0002  were determined by analyzing the ratios of fringe spacings with a 15-beam calculation. The values determined were |V 0002 | = 6.5 ± 0.5 Volt and tan Φ 0002  = -0.54 ± 0.04 on the origin at a cadmium atom. From these values the atom form factors at the position of 0002 reflection were calculated as f x  cd  = 42.4 ± 0.5 and f x  s = 13.0 ±0.2, assuming the parameter u determined by X-ray diffraction.

zeitschrift für naturforschung a

Determination of Phase Angles and Absolute Values of the Structure Potential V 0002 of Cadmium Sulfide from Equal Thickness Fringesin Electron Micrographs