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X-ray photoelectron spectra (XPS) are obtained for Mg in MgO using high quality (purity 99.999%) Mg films prepared and oxidized under pressures of 10 -6  ~ 10 -8  torr and measured on an ESCA-36 spectrometer at a pressure of 10 -8  torr. AlKα line source was used for excitation, and the minimum of Au valence band at 5.0 eV was chosen for calibration.

Valence and Core Electron Spectra of Mg in MgO in Evoporated Thin Films