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The optical constants, d. c. conductivity and Hall-effect were measured in UHV for evaporated films of Cu, Ag and Au (thickness approx. 100 nm) which were quenched, condensed and stepwise annealed. For the range of wevelengths chosen (0.9 - 2.4 μm), a density of conduction electrons and their damping frequency can be determined from the optical constants by using the Drude theory. If one compares these data with the corresponding electrical measurements, a very similar behavior is shown for the recovery. The electron density increases by a factor 1.3 - 1.6, whereas the damping frequency decreases by a factor 1.7 - 2.8.

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Vergleich optischer und elektrischer Messungen an Cu-, Ag- und Au-Schichten mit unterschiedlicher Fehlstellenkonzentration / Comparison of Optical and Electrical Measurement on Cu, Ag and Au Films with Different Lattice Defect Concentrations