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The microscopy images can be affected by periodic noise, resulting in quality degradation and the appearance of repetitive patterns on the micrograph. In order to effectively remove the periodic noise, a new adaptive method is proposed in this paper. The presented approach analyzes the frequency domain of the first order Haar Wavelet transform, determines the frequency regions that correspond to noise and corrects the magnitude spectrum components of the undecomposed DFT transform of the image. Experimental results are provided.

WAVELET AND FOURIER DECOMPOSITION BASED PERIODIC NOISE REMOVAL IN MICROSCOPY IMAGES