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This paper presents a simple method of linewidth enhancement factor (LEF) measurement of a semiconductor laser through narrowband optical frequency modulation (FM) generation by direct modulation. The narrowband optical FM is generated by using small-amplitude direct-current modulation, thereby limiting the resultant optical intensity modulation index level typically within 10%. The LEF is found to decrease linearly with the increase in bias current of the laser diode above threshold.

Linewidth Enhancement Factor Measurement of a Fabry Perot Laser Diode through Narrowband Optical FM Generation