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This study based on the standard differential evolution (DE) algorithm was carried out to address the issues of control parameter imprinting, mutation process, and crossover process in the standard DE algorithm as well as the issue of multidimensional circuit testing optimization. A rotation control vector was introduced to expand the search range in the poor strategy to the circumference range of the individual and the parent target individual, and a rotation crossover operator and a binomial poor operator were combined. Finally, an improved adaptive DE algorithm based on a multi-angle search rotation crossover strategy was obtained. The research will improve the DE algorithm to optimize the testing of multidimensional circuits. It can be noted that the improved average precision value is 0.9919 when comparing the precision recall curves of the DE algorithm before and after the change, demonstrating a significant improvement in accuracy and stability. The fitness difference of the 30-dimensional problem is discovered to be between 0.25 × 10 3  and 0.5 × 10 3  by comparing the box graphs of the 30-dimensional problem with that of the 50-dimensional problem. On the 50-dimensional problem, when calculating the F4–F10 function, the fitness difference of the improved DE algorithm is 0.2 × 10 4 –0.4 × 10 4 . In summary, the improved DE algorithm proposed in this study compensates for the shortcomings of traditional algorithms in complex problem calculations and has also achieved significant optimization results in multidimensional circuit testing.

Application of adaptive improved DE algorithm based on multi-angle search rotation crossover strategy in multi-circuit testing optimization