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Imaging of nano structures is necessary for the quality control in their manufacturing. In the case when X-rays probe the medium, only the modulus of the complex valued scattered wave field can be measured. The phase cannot be measured. In the case of the Born approximation, we obtain an explicit reconstruction formula for the unknown coefficient from the phaseless scattering data.

Explicit formula for the solution of the phaseless inverse scattering problem of imaging of nano structures