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The sintering behavior and the dielectric properties of CaO–MgO–Al 2 O 3 –SiO 2  (CMAS) glass and CMAS glass/Al 2 O 3  ceramic composites were studied by the combination of differential scanning calorimetry, X-ray diffraction and scanning electron microscopy as well as dielectric properties measurement. The results demonstrate that the CMAS glass with composition 25CaO-15MgO-12Al 2 O 3 -48SiO 2  (wt.%) can significantly improve the sintering performance of Al 2 O 3  ceramics, and does not lead to an obvious decrease in the dielectric properties. Low dielectric constant and low dielectric loss were obtained when sintering the CMAS/Al 2 O 3  composites at 1273 K, which demonstrate that it satisfies the requirement of the integrated circuit substrate materials when working at high frequency.

Crystallization kinetic and dielectric properties of CaO–MgO–Al 2 O 3 –SiO 2 glass/Al 2 O 3 composites