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The paper deals with the depth determination of residual stress states from diffraction data. First an historical overview of the known approaches is given. Then we apply the approximate inverse method to this problem. This method is known to be very efficient and stable with respect to noise-contaminated data. It is even possible to prove convergence and it allows an error estimate of the calculated depth resolved residual stress profile.

Depth-resolved residual stress evaluation from X-ray diffraction measurement data using the approximate inverse method