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The technological innovation and the relentless marketing of new electronic products with improved performance generate increasing quantities of Waste from Electrical and Electronic Equipment (WEEE). In this scenario, End-Of-Life (EOL) flat monitors and screens represent a category generating, as a consequence of the rapid change in technology, an important amount of waste. Considering future estimations, the implementation of an adequate recycling infrastructure is necessary. An efficient, reliable and low-cost analytical tool is thus needed to perform detection/control actions in order to assess: i) waste composition and ii) physical-chemical attributes of the resulting materials. The knowledge of these information is a requirement to set-up and to implement correct recycling actions.

Near infrared hyperspectral imaging-based approach for end-of-life flat monitors recycling