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Toshio Konno1, Chika Hirata1, Erlon Henrique Martins Ferreira2, Lingling Ren3, Guangzhe Piao4, José Manuel Juárez García5, Froy Martínez Suárez6, Sergio Joaquín Jiménez Sandoval6, Takatsugu Wakahara1 and Kun’ichi Miyazawa1* 1 Fullerene Engineering Group, Materials Processing Unit, National Institute for Materials Science (NIMS), 1-1, Namiki, Tsukuba, Ibaraki, 305-0044, Japan 2 National Institute of Metrology, Quality and Technology (INMETRO), Av. Nossa Sra das Graças, 50 Duque de Caxias RJ, Brazil 3 National Institute of Metrology (NIM), No. 18, Beisanhuan Donglu, Chaoyang District, Beijing, China 4 Qingdao University of Science and Technology (QUST), 53 Zhengzhou Rd., Qingdao 266042, China 5 National Center of Metrology (CENAM), km 4.5 carretara a Los Cués Municipio del Marqués Querétaro, Mexico 6 Centro de Investigación y Estudios Avanzados del Instituto Politecnico Nacional (CINVESTAV), Libramiento Norponiente No. 2000. Fracc. Real de Juriquilla, Queretaro, Mexico * Corresponding author: e-mail: miyazawa.kunichi@nims.go.jp

Precise Raman measurements of C<sub>60</sub> fullerene nanowhiskers synthesized using the liquid-liquid interfacial precipitation method