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K. Yoshino, Y. Morita, T. Nagatomi, M. Terauchi, T. Tsujita, T. Nakayama, Y. Yamauchi, M. Nishitani, M. Kitagawa, Y. Yamauchi, and Y. Takai Department of Material and Life Science, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan 3rd Device Development Group, AVC Devices Development Center, AVC Networks Company, Panasonic Corporation, Ibaraki, Osaka 567-0026, Japan Co-operation Laboratory of Panasonic, Osaka University, Suita, Osaka 565-0871, Japan Advanced Display Technology Group, Image Devices Development Center, Panasonic Corporation, Moriguchi, Osaka 570-8501, Japan National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan yoshino.kyohei@jp.panasonic.com nagatomi@mls.eng.osaka-u.ac.jp

Investigation of Measurement Conditions of Metastable De-excitation Spectroscopy of MgO Thin Films Used for Plasma Display Panels